CuW触头着色探伤缺陷的研究.pdf

电工材料2008No.4
吴文安等:CuW触头着色探伤缺陷的研究
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CuW触头着色探伤缺陷的硏究
吴文安,时代,韩会秋,李志鹏,肖春林
(辽宁金昌新材料有限公司,辽宁抚顺113008)
摘要:重点研究了CuW触头产品着色探伤缺陷的种类、缺陷材料机械性能、缺陷材料断口形貌宏观分
析,提出了CuW触头着色探伤缺陷的判定原则和方法。材料性能试验结果表明,着色探伤缺陷产品中
具有CuW疏松、CuW-Cu界面裂纹、Cu端裂纹和Cυ端疏松缺陷的材料其抗拉强度、硬度低于无缺陷
材料,不符合CuW触头的技术要求;具有CuW-Cu界面气孔缺陷的材料其抗拉强度与无缺陷材料相
当,符合CuW触头的技术要求。通过对CuW触头着色探伤缺陷断口组织形貌宏观分析,发现着色探伤
缺陷部位是CuW触头的内部缺陷组织,材料缺陷具有一定的深度,在材料受力时预先开裂,产生了应
力集中,减少了材料的受力面积,使CuW触头的机械性能降低,这是导致CuW触头着色探伤缺陷机械
性能低的原因。
关键词:CuW合金;触头;着色探伤;探伤缺陷;粉末治金
中图分类号:TM206文献标志码
文章编号:1671-8887(2008)04-0033-05
Detection of Defects in Cuw Contactor
by Dye Penetration
WU Wen-an, SHI Dai, HAN Hui-qiu, LI Zhi-peng, XIAO Chun-lin
(Liaoning Jinchang New Materials Co LTD Fushun Liaoning 113008, China)
Abstract: Different kinds ot defects in Cuw contactor were detected by dye penetration
method and a criterion was put forward to distinguish these defects in this paper. Most o
defects, such as Cuw porosity, Cuw-cu interface crack, crack and porosity in Cu part
damaged the mechanical properties greatly, leading to lower tensile strength and lower
hardness of Cuw contactor, which was not qualified to the technical request. The reason
for poor mechanical properties mentioned above might be rationalized that theses defects
promote the formation of stress concentration and then develop crack when suffering load
by analyzing the fracture morphology of these defects. However, some defects like pores
at the Cuw-cu intcrface hade no negative effect on the mechanical properties of Cuw
contactor, which could be classified to qualified product
Key
alloy; contactor; dye penetration; detection of defects; powder metallurgy
引言
80kA;550kV、100kA)的情况下,要求高压开关
电力系统规模的扩大和电力市场的发展对配GCB和GIS具有高的工作可靠性。CuW触头是
电网络和配电系统的要求不断提高,配电网络不仅GCB和GIS的核心元件,决定了GCB和GIS的使
要保证重要用户的供电可靠性,而且应该保证整个用性能和寿命,高性能、无缺陷的CuW触头才能保
配电系统的可靠性",特别是在超高电压(550kV,证高可靠性的GCB和GIS。高性能CuW触头的制
800kV)、特高电压(1200kV)和特大容量(245kV、造,除了具有先进的制造工艺外,更重要的是应具有
科学合理的检测方法,这样才能保证CuW触头没
作者筒介:吴文安(1962-),男,高级工程师,从事电工合金、粉末
治金材料的研究,(电话)0413-4629159(电子倍箱) Injcwwa@
有材料缺陷,发挥出高性能。国内外制造商在制造
CuW触头时,对材料缺陷的检测方法主要采用着色
收稿日期:2008-08-01
探伤(或荧光探伤)和超声探伤等;但是,国内文