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类型SEMI G70-0996 STANDARD FOR EQUIPMENT AND LEADFRAME.pdf

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    SEMI G70-0996 STANDARD FOR EQUIPMENT AND LEADFRAME G70 0996
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    SEMI G70-0996
    STANDARD FOR EQUIPMENT AND LEADFRAME FXTURES FOR
    MEASUREMENT OF PLASTIC PACKAGE LEADFRAMES
    1 Purpose
    Pub. No. 95 Registered and standard Outlines for
    1.1 This standard describes the equipment and lead
    Semiconductor Devices
    frame fixtures used for measurement of Z axis dimen
    4 Terminology
    sions of plastic package leadframes
    NOTE 2 See SEMI G57 for leadframe features termi
    2 Scope
    nolog
    2.1 This standard mainly describes the equipment and 4.1 burr height-maximum height of burr above the
    leadframe fixture for measurement of leadframes
    plane which it protrudes.(See Figure 1.)
    are <0. 15 mm in thickness as used fortsop and
    TQFP packages listed in group I in Table I
    2.3 This standard also may be applied for leadframe
    of conventional packages which are 2 0.2 mm in thick
    nes
    Table 1. Package Classification
    Group I
    Group II
    SSOP
    DIP
    TSOP
    ZIP
    TSSOP
    SOJ
    QFP
    Burr Height
    SOP
    TQFP
    QF J C PLCC)
    LQFP
    ongitudinal bowing of the leadframe
    strip length.(See Figure 2.
    SVP
    NOTE 1: Packages should be classified by EIAJ and
    Forward
    JEDEC specifications
    3 Referenced Documents
    3 1 SEEMI Standard
    SEMI G57 Guideline for Standardization of Lead
    i-1 Coil Set
    Trame l erminology
    3.2 EIAJ Standard
    E1-741 1 General Rules for the Preparation of Out
    F
    ure
    2
    line Drawings of Integrated Circuits, Packages Name
    and Code
    Coill Set
    3.3 JEDEC Specifications
    1 Standards of Electronic Industries Association of Japan, osho Bldg
    51 3-2-2 Marunouchi, Chiyoda-ku, lokyo, Japan 100
    2 JEDEC Standard, 2001 Eve Street, N H, Washington DC, 20006
    SEM G70-0996 G SEM 1996
    4.3 coined deplh -The difference in height between 4.6 die pad dimple deplh-the maximum depth of
    the top surface of the coined area of an inner lead and the dimple. (See Figure 5.)
    the t
    ed area at the tip of the
    Inner lead coining produces a flattened section of the
    lead that is suitable for wire bonding. (See Figure 3.)
    ??
    ??
    Dimple
    Dimple
    Coined Deptl
    Figure 5
    Die Pad Dimple Depth
    f the cente
    Figure 3
    die pad surface from a plane established by the four cor
    oined Depth
    ner points of die pad. (See Figure 6.
    4.4 crossbow- Transverse bowing of the leadframe
    See Figure 4.)
    St
    HA E B
    Y axis
    X axis
    Figure 4
    Crossbow
    4.5 die pad dimple-a hollow formed in a die pad
    lfigure 6
    using a half-etching technique or stamping to improve
    IDIE Pad Flatness
    the adhesive strength with the die or molding com-
    pound and to reduce the stress between the die pad and
    the die
    SEMG70-09960 1996
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