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EIA JESD22-A101-B-1997 Steady-State Temperature Humidity Bias Life Test.pdf

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    EIA JESD22-A101-B-1997 Steady-State Temperature Humidity Bias Life Test JESD22 A101 1997 Steady Stat
    资源描述:
    EIAJEDEC
    STTANDARD
    mossoom
    l'est Miethod AL0I-B
    Steady State Temperature Humidity
    Bias Life Ttest
    EIAJJESD22-A101-B
    (Revision OFJESD22-A101-A)
    APRIL 1997
    ELECTRONIC INDUSTRIES ASSOCIATION
    ENGINEERING DEPARTMENT
    JEDEC Standard No. 22-A101-B
    Page 1
    Test Method A101-B Steady State Temperature Humidity Bias Life Test
    From JEDEC Council Ballot JCB-96-64, formulated under the cognizance of JC-14
    Committee on Reliability Test Methods for Packaged Devices.
    I Purpose
    The Steady-state Temperature Humidity Bias Life Test is peformed for the purpose of
    evaluating the reliability of non-hermetic packaged solid-state devices in humid environments. It
    employs conditions of temperature, humidity, and bias which accelerate the penetration of
    moisture through the external protective material (encapsulant or seal)or along the inteface
    between the external protective material and the metallic conductors which pass through it
    2 Apparatus
    The test requires a temperature-humidity test chamber capable of maintaining a specified
    temperature and relative humidity continuously, while providing electrical connections to the
    devices under test in a specified biasing configuration
    2.1 Temperature and relative humidity
    The chamber must be capable of providing controlled conditions of temperature and relative
    humidity during ramp-up to, and ramp-down from the specified test conditions
    2.2 Devices under stress
    Devices under stress must be physically located to minimize temperature gradients
    2.3 Minimize release of contamination
    Care must be exercised in the choice of board and socket materials. to minimize release of
    contamination, and to minimize degradation due to corrosion and other mechanisms
    2.4 onic contamination
    Tonic contamination of the test apparatus(card cage, test boards, sockets, wiring, storage
    containers, etc. ) shall be controlled to avoid test artifacts
    2.5 Deionized water
    Deionized water with a minimum resistivity of 1 megohm-cm at room temperature shall be used
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