SEMI G75.6-0698 TEST METHOD FOR MEASUREMENT OF THE.pdf

SEM G75.6-0698
TEST METHOD FOR MEASUREMENT OF THE SHRINKAGE FACTOR
OF LEADFRAME TAPE
1 Summary of Method
I The length of tape samp
eles is measured before an
Marks
after exposure to temperatures comparable to those
used in the assembly and packaging of IC. The shrink
age is calculated as a percentage in the dimension mea
10 mm
sure
2 Equipment
L(L1,L2)
2. I Magnifying projector with 0.01 mm accuracy
100mn
2.2 Circulating air oven capable of 300 +2 C accu
Figure 1
racy
Size of a Marked Specimen
2. 3 Cutting die for sample preparation
2.4 Thermohygrostat
5 Test Conditions
2. 5 Straight eds
5.1 Baking Condition I-100°cfor60土1 minute.
2.6 Scribing tool
5.2 Baking Condition2-200°Cfor60土1 minute.
5.3 Baking Condition3-300°Cfor10±0.5min
3 Sampling
3. I The sampling is one sample per one lot. The ven- NOTE: Alternate temperatures may be used bv agree
dor must report the definition of lot, if the customer ment between vendor and customer
requires lt
6 Procedure
4 Preparation of Specimens
6.1 Place a specimen between the glass plates of th
4.1 Cut specimens out of the samples using the cutting
magnifying projector and measure the length
die. The specimen shall be 100+1.0 mm long and 10+
letween two marks (see Figure 1). Repeat this mea
1.0 mm wide
surement for all specimens
4.2 Allow the specimen to be stabilized at 23+ 2
6.2 Place the specimen in the oven at the appropriate
and 50 +5% RH for 16 hours minimum. This may be test condition
carried out in a climate controlled room or in a thermo
hygrostat
6.3 Remove the specimens from the oven and store at
23°土2Cand50±5% RH for16 hours minimun
4. 3 Using the straight edge and scribing tool, scribe
ad the distance to be measured, L, shall be parallel to L>, between two marks used in Section e
marks on the specimens as shown in Figure I Th
6.4 Place the specimens between th
lates of
marks shall be parallel to each edge of the specimen, the magnifying projector and measure the new length,
the long side of the specimen. The mark shall be
located within 5 mm of the ends of the specimen
SEMI G75,6-06989SEMI1998