SEMI G80-0200 TEST METHOD FOR THE ANALYSIS OF OVERALL.pdf

SEM G80-0200
TEST METHOD FOR THE ANALYSIS OF OVERALL DGTAL TMNG
ACCURACY FOR AUTOMATED TEST EQUIPMENT
This test method was technically approved by the Global Automated Test Equipment Committee and is the
direct responsibility of the North American Automaled Test Equipment Committee. Current edition approved
In Rcgional Standards Commillcc on Scptcmbcr 3, 1999. Initially availablc on SEM
Onlinc Deccmbcr 1999: to bc published Fcbruary 2000
1 Purpose
3 Limitations
1. 1 This procedure will define a standard process 3.1 The following limitations are inherent to this
Where
rated circuit(C)ATE system procedure
that makel
AC
3.1 I The tolerances of each measurement used in the
timing accuracy specification
procedure are listed in each test, where appropriate
2 Application of this procedure will simplify ATE
comparisons, reduce specification ambiguity, simplify
ying
user acceptance procedures. simplify ATE performance
environmental conditions, so results may not reflect
monitoring, and provide a common validation criteria
performance at environmental limits
for ATE suppller
3. 12. 1 Due to execution time limits. the verification
procedure does not represent an exhaustive analysis
2 Scope
The number of data points analyzed is intended to pro-
2. 1 This procedure is intended for analysis of timing
vide a minimum representative assessment of AC tim
accuracy
ifications for all semiconductor automatic ing accuracy parameters in a practical amount of time
test equipment (ATE )capable of digital functional 3. 1. 3 This method uses only edge co mare mode and
testing. The extent of the analysis includes overall non-multiplexed operation in providing
mimimum
timing accuracy and the primary components of overall representative assessment of AC timing accuracy
timing accuracy as defined in the definition section of
this document
3. 14 This method does not determine the effects that
duty cycle variations have on AC timing accuracy
analy
of th
following parameters associated with ATE timing
1.5 Not being an exhaustive analysis this method
accuracy
avoids comprehensive testing as might be expected for
complex AC timing functions such as on-the-fly(OTT
minimum driver pulse width
timing. This method was defined with the intention of
comparator bandwidth
keeping the data gathering practical such that
meaningful results are obtained in a reasonable amount
LO round trip delay
of time. In the case of timing-on-the fly a routine is
contained in this method and can be used as a reference
test fixturing error
parameter for comparative purposes when systems with
e device insertion errors
on-the-fly timing are analyzed. Thus only the
fundamental AC timing results are produced and
time measurement unit(TMU)accuracy, and
ATE capability or performance beyond AC timing accuracy(OTA )resl as Part of the overall timing
s not Included
accuracy
3.1.6 Discretion is advised when interpreting OTA
2.3 Application of this procedure can reduce result
Self-
equipment acceptance time resulting in savings for both
(compliant )method results should be viewed with og
allow for all error components to be isolated. Thus good
the end-users and