GOST R IEC 60904-10-2013.pdf

60904-10 2013 10 IEC 60904-10:2009 Photovoltaic devices Part 10:Methods of linearity measurement(IDT)2014 61904-102013 1 -(),4 2 039,3 05 2013.2161-01 2015.4 60904-10:2009 .10.(IEC 60904-10:2009 Photovoltaic devices Part 10:Methods of linearity measurement)1.52012(3.5).,5 1.02012(8).,.().,(gost.ru),2014 ,II 61904-102013 10 Photovoltaic devices.Part 10.Methods of linearity measurement 20150101 1.,.-.,(,)(.60891 61829).,:/,.,.,.,.-,.60891:().,.5 6.,(5.3)(6).,(,),.,8 .1 61904-102013 2 .().60891 .-(IEC 60891:2009,Photovoltaic devices of crystalline silicon/Procedures for temperature and irradiance corrections to measured current voltage characteristics)60904-1 .1.-(IEC 60904-1,Photovoltaic devices Part 1:Measurement of photovoltaic current-voltage characteristics)60904-3 .3.(IEC 60904-3,Photovoltaic devices Part 3:Measurement principles for terrestrial photovoltaic(PV)solar devices with reference spectral irradiance data)60904-7 .7.(IEC 60904-7,Photovoltaic devices Part 7:Computation of spectral mismatch correction for measurements of photovoltaic devices)60904-8 .8.(IEC 60904-8,Photovoltaic devices Part 8:Measurement of spectral response of a photovoltaic(PV)device)60904-9 .9.(IEC 60904-9,Photovoltaic devices Part 7:Solar simulator performance requirements)61215 .(IEC 61215,Crystalline silicon terrestrial photovoltaic(PV)modules Design qualification and type approval)61646 .(IEC 61646 Thin-film terrestrial photovoltaic(PV)modules Design qualification and type approval)/17025 (ISO/IEC 17025 General requirements for the competence of testing and calibration laboratories)3 a),-(.60904-1).b),.,.2 61904-102013 0,5%(.60904-7 60904-8).c),.d).e),(,)60904-8 2%.60904-7 ,60904-8 .4 ,.,.5 .5.1 5.1.1 ,:,.,(,),2%,.2/.5.1.2 ,.1.,.,.5.1.3 ,.,:a),1,b),3 61904-102013 c),.5.1.4 5.1.9 1.5.1.4 ,():Xi,;Yi;,T I;().5.1.5 I I .,I(1/).,(1);,1000/2;,25.,60904-7 AM 1,5.,.(1).5.1.6 Xi ,.(2),.:a),.,.().,60904-9 ,4 61904-102013 .b),.,()(I)(I ).,60904-9 (),.1%.,.c).,1.(I),(I ).,.60.5.1.7 Xi ,.5.1.4 .5.1.8 ,1,2%(,).5.1.9 ,5.1.4 5.1.8,Xi,.Xi ,i,.,.,.5 61904-102013 5.2 60904-9.(.60904-1).:1 ,.(),(),.,.2 I,FF .,.,15%.5.2.1 ,2.5.2.2 ,.,1.5.2.4 5.2.9 1.5.2.3 ./,.5.2.4 ,5.2.2,():Xi,;Yi;T I;().5.2.5 E I I .,I(1/).,(3)T ;6 61904-102013 E ,1000/2;T ,25.,60904-7,AM 1,5.,.(3).5.2.6 Xi ,.(4),-,.:a).,.(I),(I ).b).,.,.c).,(0,5%).:;,;1.,(I),(I ).,.d),.,.().e),.,().7 61904-102013 (I)(I ).:1 1%.,.2 ,a)e),.5.2.7 Xi ,(.10.4 61215 61646).5.2.8 ,1.5.2.9 ,5.2.45.2.8,Xi,.Xi ,i,.5.3 ,60904-8.Xi ,i,.(),60904-3.6 6.1 ,(),(),(5);.6.2 ,.,BBA(60904-9).,0,5%.8 61904-102013 6.3 6.3.1 ,2.6.3.2 5 5.1.3 5.2.3.6.3.3 ,5.2.3,.,.(.5.2.6).6.3.4 A B ,().:;.6.3.5 ,6.3.3 6.3.4,.6.3.6 ,6.3.3-6.3.5,.,6.3.4.7 ,5,6,.60891.,8.,/8.7.1 ,5,.9 61904-102013 ,.7.1.1 ,:1.Y (i-),k i-,k 3;-i;-Y j i.2.X Y :n ,n 5.3.()m 4.m,.:1:,.2 ,.7.1.2 (),m ,Xi,Yi i Y .10 61904-102013 7.2 :.(),.,.,8 .8 ,.,:a)2%.b)5%.c),5%.0,1%/,.8.,/17025.:a);b),;c);d);e);f);g)()();h)();i);j),;k),;l),;m)();n),8;o),;p),;q),;r),.11 61904-102013 ()().1 60891 MOD 2897691(89187).-60904-1 MOD 2897791(904-187).1.-60904-3-*60904-8-*60904-9-*61215-*61646 IDT 616462012 ./17025 IDT /170252009 *.:-IDT ;-MOD .12 61904-102013 1 60891 .-(IEC 60891,Photovoltaic devices of crystalline silicon/Procedures for temperature and irradiance corrections to measured current voltage characteristics)2 61829 .-(IEC 61829 Crystalline silicon photovoltaic(PV)array On-site measurement of I-V characteristics)3 60904-1 .1.-(IEC 60904-1,Photovoltaic devices Part 1:Measurement of photovoltaic current-voltage characteristics)4 60904-7 .7.(IEC 60904-7,Photovoltaic devices Part 7:Computation of spectral mismatch correction for measurements of photovoltaic devices)5 60904-8 .8.(IEC 60904-8,Photovoltaic devices Part 8:Measurement of spectral response of a photovoltaic(PV)device)6 61215 .(IEC 61215,Crystalline silicon terrestrial photovoltaic(PV)modules Design qualification and type approval)7 61646 .(IEC 61646 Thin-film terrestrial photovoltaic(PV)modules Design qualification and type approval)8 60904-9 .9.(IEC 60904-9,Photovoltaic devices Part 7:Solar simulator performance requirements)9/17025 (ISO/IEC 17025 General requirements for the competence of testing and calibration laboratories)13 61904-102013 697.329 27.160 60 :,01.04.2014.60 x841/8.1,90.31.1091 ,123995,.,4.www.gostinfo.ru infogostinfo.ru